Modeling of Flow Field and Abrasive Particles in Chemical Mechanical Polishing (CMP) Equipment

Application ID: 140171


Chemical mechanical polishing (CMP) is a crucial technique for surface planarization, widely used in semiconductor fabrication and optical device manufacturing.

This model simulates the flow field within the CMP retaining ring and tracks the motion of abrasive particles carried by the flow. The rotating flow field is modeled using the frozen rotor approach.

This model example illustrates applications of this type that would nominally be built using the following products: